| 54 |
Title |
TI |
[EN] ELECTRICAL MEASURING SYSTEM |
| 71/73 |
Applicant/owner |
PA |
FRIEDRICH ALEXANDER UNIVERSIATAET ERLANGEN NRERNBERG, DE
;
SIEDLE HORST GMBH & CO KG, DE
;
UNIV FRIEDRICH ALEXANDER ER, DE
|
| 72 |
Inventor |
IN |
BARBON FRANCESCO, DE
;
DINGLER PETER, DE
;
HALDER ERNST, DE
;
KÖLPIN ALEXANDER, DE
;
LINDNER STEFAN, DE
;
MANN SEBASTIAN, DE
;
VINCI GABOR, DE
|
| 22/96 |
Application date |
AD |
Feb 11, 2014 |
| 21 |
Application number |
AN |
201414177672 |
|
Country of application |
AC |
US |
|
Publication date |
PUB |
Aug 21, 2014 |
33
31
32 |
Priority data |
PRC
PRN
PRD |
DE
102013202765
20130220
|
| 51 |
IPC main class |
ICM |
G01S 13/02
(2006.01)
|
| 51 |
IPC secondary class |
ICS |
|
|
IPC additional class |
ICA |
|
|
IPC index class |
ICI |
|
|
Cooperative patent classification |
CPC |
G01F 23/284
G01S 13/02
G01S 13/08
G01S 13/88
|
|
MCD main class |
MCM |
G01S 13/02
(2006.01)
|
|
MCD secondary class |
MCS |
|
|
MCD additional class |
MCA |
|
| 57 |
Abstract |
AB |
[EN] A measuring system is described which includes a sensor for receiving an electromagnetic wave and a guide component for guiding the electromagnetic wave. The guide component is embodied as an elongated, preferably metal, profile component which contains, in a longitudinal direction, a slot for guiding the electromagnetic wave. |
| 56 |
Cited documents identified in the search |
CT |
US000004375057A
US020090309012A1
US020100066387A1
US020110105019A1
US020120056778A1
US020120323503A1
|
| 56 |
Cited documents indicated by the applicant |
CT |
|
| 56 |
Cited non-patent literature identified in the search |
CTNP |
Microtech, Inc; Manufacturers Precision Microwave Components Cheshire, CT U.S.A.; Date :October 21, 2003. 9
|
| 56 |
Cited non-patent literature indicated by the applicant |
CTNP |
|
|
Citing documents |
|
US000010871556B2
US000010890466B2
WO002019197029A1
|
|
Sequence listings |
|
|
|
Search file IPC |
ICP |
G01S 13/02
G01S 13/08
G01S 13/88
|
